Semiconductor Laser Engineering, Reliability and Diagnostics (A Practical Approach to High Power and Single Mode Devices) || Novel Diagnostic Data for Diverse Laser Temperature Effects; Dynamic Laser Degradation Effects; and Mirror Temperature Maps
Epperlein, Peter W.Year:
2013
Language:
english
DOI:
10.1002/9781118481882.ch9
File:
PDF, 3.25 MB
english, 2013