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Combining Results of Accelerated Radiation Tests and Fault Injections to Predict the Error Rate of an Application Implemented in SRAM-Based FPGAs
Velazco, Raoul, Foucard, Gilles, Peronnard, PaulLanguage:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2010.2087355
Date:
December, 2010
File:
PDF, 335 KB
english, 2010