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Valence-Band and Chemical-State Analyses of Zr and O in Thermally Grown Thin Zirconium-Oxide Films: An XPS Study
Bakradze, Georgijs, Jeurgens, Lars P. H., Mittemeijer, Eric J.Volume:
115
Language:
english
Journal:
The Journal of Physical Chemistry C
DOI:
10.1021/jp206896m
Date:
October, 2011
File:
PDF, 1.74 MB
english, 2011