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[IEEE 2010 IEEE International Conference of Electron Devices and Solid- State Circuits (EDSSC) - Hong Kong (2010.12.15-2010.12.17)] 2010 IEEE International Conference of Electron Devices and Solid-State Circuits (EDSSC) - Total ionizing dose effects on 4-transistor CMOS image sensor pixels
Jiaming Tan,, Theuwissen, A J PYear:
2010
Language:
english
DOI:
10.1109/EDSSC.2010.5713738
File:
PDF, 839 KB
english, 2010