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Spatial distribution of vacancy defects in GaP wafers
DomiÌnguez-Adame, F., Piqueras, J., de Diego, N., Llopis, J.Volume:
63
Year:
1988
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.340994
File:
PDF, 596 KB
english, 1988