Software-Based Self-Testing With Multiple-Level Abstractions for Soft Processor Cores
Chung-Ho Chen,, Chih-Kai Wei,, Tai-Hua Lu,, Hsun-Wei Gao,Volume:
15
Language:
english
Journal:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
DOI:
10.1109/TVLSI.2007.893650
Date:
May, 2007
File:
PDF, 678 KB
english, 2007