NiO as a test case for high resolution resonant inelastic...

Journal of Physics Condensed Matter 2005 / 09 Vol. 17; Iss. 35

NiO as a test case for high resolution resonant inelastic soft x-ray scattering

Ghiringhelli, G, Matsubara, M, Dallera, C, Fracassi, F, Gusmeroli, R, Piazzalunga, A, Tagliaferri, A, Brookes, N B, Kotani, A, Braicovich, L
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Volume:
17
Language:
english
Journal:
Journal of Physics: Condensed Matter
DOI:
10.1088/0953-8984/17/35/007
Date:
September, 2005
File:
PDF, 873 KB
english, 2005
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