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SPIE Proceedings [SPIE SPIE Optical Metrology - Munich, Germany (Monday 23 May 2011)] Optical Measurement Systems for Industrial Inspection VII - Influences of colorful LED emissions on spectrophotometric properties of a LED based white light source
Sametoglu, F., Celikel, O., Lehmann, Peter H., Osten, Wolfgang, Gastinger, KayVolume:
8082
Year:
2011
Language:
english
DOI:
10.1117/12.882190
File:
PDF, 239 KB
english, 2011