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Characterization of Defect Levels in Doped and Undoped CuGaSe2 by Means of Photoluminescence Measurements
J. H. Schön, O. Schenker, H. Riazi-Nejad, K. Friemelt, Ch. Kloc, E. BucherVolume:
161
Year:
1997
Language:
english
Pages:
13
DOI:
10.1002/1521-396x(199705)161:13.0.co;2-q
File:
PDF, 314 KB
english, 1997