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Fourier-transform infrared reflection study of the morphology of porous semiconductor structures
Belogorokhov, A, Pusep, Yu A, Belogorokhova, LVolume:
12
Language:
english
Journal:
Journal of Physics: Condensed Matter
DOI:
10.1088/0953-8984/12/16/311
Date:
April, 2000
File:
PDF, 63 KB
english, 2000