[IEEE 2012 79th ARFTG Microwave Measurement Conference...

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[IEEE 2012 79th ARFTG Microwave Measurement Conference (ARFTG) - Montreal, QC, Canada (2012.06.22-2012.06.22)] 79th ARFTG Microwave Measurement Conference - Time domain large signal characterization of self-biasing phenomena in switch-mode AlGaN/GaN HEMTs

Faraj, J., Callet, G., Jardel, O., El-Rafei, A., De Groote, F., Quere, R., Teyssier, J-P.
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Year:
2012
Language:
english
DOI:
10.1109/ARFTG79.2012.6291191
File:
PDF, 127 KB
english, 2012
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