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X-ray diffraction, Raman study and electrical properties of the new mixed compound Rb1.7K0.3(SO4)0.88(SeO4)0.12Te(OH)6
Djemel, M., Abdelhedi, M., Ktari, L., Dammak, M.Volume:
1047
Language:
english
Journal:
Journal of Molecular Structure
DOI:
10.1016/j.molstruc.2013.04.055
Date:
September, 2013
File:
PDF, 1.14 MB
english, 2013