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TDDB Monitoring and Compensation Circuit Design for Deeply Scaled CMOS Technology
Nan, Haiqing, Choi, KyuwonVolume:
13
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/TDMR.2011.2167624
Date:
March, 2013
File:
PDF, 380 KB
english, 2013