A New Reliability Evaluation Methodology With Application...

IEEE Transactions on Device and Materials Reliability 2013 / 03 Vol. 13; Iss. 1

A New Reliability Evaluation Methodology With Application to Lifetime Oriented Circuit Design

Sajjadi-Kia, Hamed, Ababei, Cristinel
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Volume:
13
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/TDMR.2012.2228862
Date:
March, 2013
File:
PDF, 1.44 MB
english, 2013
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