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[IEEE International Electron Devices Meeting 1999. Technical Digest - Washington, DC, USA (5-8 Dec. 1999)] International Electron Devices Meeting 1999. Technical Digest (Cat. No.99CH36318) - Accurate thermal noise model for deep-submicron CMOS

Scholten, A.J., Tromp, H.J., Tiemeijer, L.F., Van Langevelde, R., Havens, R.J., De Vreede, P.W.H., Roes, R.F.M., Woerlee, P.H., Montree, A.H., Klaassen, D.B.M.
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Year:
1999
Language:
english
DOI:
10.1109/IEDM.1999.823868
File:
PDF, 321 KB
english, 1999
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