[IEEE 2008 Microwaves, Radar and Remote Sensing Symposium (MRRS) - Kiev, Ukraine (2008.09.22-2008.09.24)] 2008 Microwaves, Radar and Remote Sensing Symposium - Material parameter measurements for microwave anti reflection coating development
Nagy, LajosYear:
2008
Language:
english
DOI:
10.1109/MRRS.2008.4669544
File:
PDF, 2.67 MB
english, 2008