![](/img/cover-not-exists.png)
[IEEE Device Research Conference. Conference Digest - Notre Dame, IN, USA (25-27 June 2001)] Device Research Conference. Conference Digest (Cat. No.01TH8561) - Linearity of high Al-content AlGaN/GaN HEMTs
Jenkins, T., Kehias, L., Parikh, P., Wu, Y.-F., Chavarkar, P., Moore, M., Mishra, U.Year:
2001
Language:
english
DOI:
10.1109/DRC.2001.937931
File:
PDF, 170 KB
english, 2001