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SPIE Proceedings [SPIE Optics & Photonics - San Diego, CA (Sunday 13 August 2006)] Optical Systems Degradation, Contamination, and Stray Light: Effects, Measurements, and Control II - Stray light reduction in testing of NIRSpec subsystems: the focal plane array and micro-shutter assembly
Connelly, Joseph A., Hadjimichael, Theo J., Boucarut, Rene A., Tveekrem, June L., Mott, D. Brent, Uy, O. Manuel, Straka, Sharon A., Fleming, John C., Dittman, Michael G.Volume:
6291
Year:
2006
Language:
english
DOI:
10.1117/12.678513
File:
PDF, 344 KB
english, 2006