Adaptive Gate Bias for Power Amplifier Temperature...

IEEE Transactions on Device and Materials Reliability 2011 / 09 Vol. 11; Iss. 3

Adaptive Gate Bias for Power Amplifier Temperature Compensation

Chen, Shuyu, Yuan, Jiann-Shiun
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Volume:
11
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/TDMR.2011.2160264
Date:
September, 2011
File:
PDF, 992 KB
english, 2011
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