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[IEEE 2010 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD 2010) - Bologna, Italy (2010.09.6-2010.09.8)] 2010 International Conference on Simulation of Semiconductor Processes and Devices - Modeling of NQS effects in carbon nanotube transistors
Claus, Martin, Mothes, Sven, Schroter, MichaelYear:
2010
Language:
english
DOI:
10.1109/SISPAD.2010.5604527
File:
PDF, 129 KB
english, 2010