Statistical Timing Models for Large Macro Cells and IP Blocks Considering Process Variations
Goel, Amit, Vrudhula, Sarma, Taraporevala, Feroze, Ghanta, PraveenVolume:
22
Language:
english
Journal:
IEEE Transactions on Semiconductor Manufacturing
DOI:
10.1109/TSM.2008.2011629
Date:
February, 2009
File:
PDF, 670 KB
english, 2009