[IEEE 2010 International Conference on Measuring Technology and Mechatronics Automation (ICMTMA 2010) - Changsha City, China (2010.03.13-2010.03.14)] 2010 International Conference on Measuring Technology and Mechatronics Automation - Classification of Hyperspectral Image with Feature Selection and Parameter Estimation
Gao, Hengzhen, Mandal, Mrinal K., Wan, JianweiYear:
2010
Language:
english
DOI:
10.1109/ICMTMA.2010.765
File:
PDF, 299 KB
english, 2010