Coupling length of silicon-on-insulator directional couplers probed by Fourier-space imaging
JaÌgerskaÌ, J., Le Thomas, N., HoudreÌ, R., Beggs, D. M., OâBrien, D., Krauss, T. F.Volume:
92
Year:
2008
Language:
english
Journal:
Applied Physics Letters
DOI:
10.1063/1.2909575
File:
PDF, 595 KB
english, 2008