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Dielectric breakdown strength in sol-gel derived PZT thick films
Chen, H. Daniel, Udayakumar, K. R., Li, Kewen K., Gaskey, Christopher J., Cross, L. EricVolume:
15
Language:
english
Journal:
Integrated Ferroelectrics
DOI:
10.1080/10584589708015699
Date:
February, 1997
File:
PDF, 768 KB
english, 1997