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[IEEE 30th Annual Conference of IEEE Industrial Electronics Society, 2004. IECON 2004 - Busan, South Korea (2-6 Nov. 2004)] 30th Annual Conference of IEEE Industrial Electronics Society, 2004. IECON 2004 - Comparative study of PCA approaches in process monitoring and fault detection
Tien, D.X., Khiang-Wee Lim,, Liu Jun,Volume:
3
Year:
2004
Language:
english
DOI:
10.1109/IECON.2004.1432212
File:
PDF, 1.24 MB
english, 2004