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[IEEE Eighth IEEE International On-Line Testing Workshop (IOLTW 2002) - Isle of Bendor, France (8-10 July 2002)] Proceedings of the Eighth IEEE International On-Line Testing Workshop (IOLTW 2002) - A BIST-based solution for the diagnosis of embedded memories adopting image processing techniques
Appello, D., Fudoli, A., Tancorre, V., Corno, F., Rebaudengo, M., Sonza Reorda, M.Year:
2002
Language:
english
DOI:
10.1109/OLT.2002.1030220
File:
PDF, 361 KB
english, 2002