Thickness-Dependent Interfacial Coulomb Scattering in Atomically Thin Field-Effect Transistors
Li, Song-Lin, Wakabayashi, Katsunori, Xu, Yong, Nakaharai, Shu, Komatsu, Katsuyoshi, Li, Wen-Wu, Lin, Yen-Fu, Aparecido-Ferreira, Alex, Tsukagoshi, KazuhitoVolume:
13
Language:
english
Journal:
Nano Letters
DOI:
10.1021/nl4010783
Date:
August, 2013
File:
PDF, 1.67 MB
english, 2013