![](/img/cover-not-exists.png)
Atomic force microscope cantilever calibration using a focused ion beam
Slattery, Ashley D, Quinton, Jamie S, Gibson, Christopher TVolume:
23
Language:
english
Journal:
Nanotechnology
DOI:
10.1088/0957-4484/23/28/285704
Date:
July, 2012
File:
PDF, 1.61 MB
english, 2012