Atomic force microscope cantilever calibration using a...

Atomic force microscope cantilever calibration using a focused ion beam

Slattery, Ashley D, Quinton, Jamie S, Gibson, Christopher T
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Volume:
23
Language:
english
Journal:
Nanotechnology
DOI:
10.1088/0957-4484/23/28/285704
Date:
July, 2012
File:
PDF, 1.61 MB
english, 2012
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