[IEEE 2008 IEEE International Symposium on Electromagnetic Compatibility - EMC 2008 - Detroit, MI (2008.08.18-2008.08.22)] 2008 IEEE International Symposium on Electromagnetic Compatibility - Shielding analysis of enclosure with aperture irradiated by plane wave with arbitrary incident angle and polarization direction
Dan Shi,, Yuanmao Shen,, Fangmin Ruan,, Zhongan Wei,, Yougang Gao,Year:
2008
Language:
english
DOI:
10.1109/ISEMC.2008.4652130
File:
PDF, 249 KB
english, 2008