Raman determination of uniformity of multilayer Si/Ge structures with Ge quantum dots
Talochkin, A B, Cherkov, A GVolume:
20
Language:
english
Journal:
Nanotechnology
DOI:
10.1088/0957-4484/20/34/345702
Date:
August, 2009
File:
PDF, 306 KB
english, 2009