Kelvin probe force gradient microscopy of charge...

Journal of Applied Physics 2011 Vol. 110; Iss. 8

Kelvin probe force gradient microscopy of charge dissipation in nano thin dielectric layers

Dunaevskiy, M. S., Alekseev, P. A., Girard, P., Lahderanta, E., Lashkul, A., Titkov, A. N.
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Volume:
110
Year:
2011
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.3651396
File:
PDF, 1.77 MB
english, 2011
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