[IEEE 2010 17th IEEE International Conference on Image...

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[IEEE 2010 17th IEEE International Conference on Image Processing (ICIP 2010) - Hong Kong, Hong Kong (2010.09.26-2010.09.29)] 2010 IEEE International Conference on Image Processing - A new validation approach for the growth rate measurement using elastic phantoms generated by state-of-the-art microfluidics technology

El-Baz, A., Sethu, P., Gimel'farb, G., Khalifa, F., Elnakib, A., Falk, R., El-Ghar, M. Abo
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Year:
2010
Language:
english
DOI:
10.1109/ICIP.2010.5652318
File:
PDF, 1013 KB
english, 2010
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