A method for the determination of the noise parameters in...

A method for the determination of the noise parameters in preamplifying systems for semiconductor radiation detectors

Bertuccio, G., Pullia, A.
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Volume:
64
Year:
1993
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.1144293
File:
PDF, 915 KB
english, 1993
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