A developed full-field fem analysis combined with ESPI for the investigation of defect evolution in polymer films
Liu, Xiao-fang, Tan, Shuai-xia, Zhang, Xiao-li, Zhao, Ning, Xu, JianVolume:
31
Language:
english
Journal:
Chinese Journal of Polymer Science
DOI:
10.1007/s10118-013-1294-8
Date:
July, 2013
File:
PDF, 893 KB
english, 2013