A New Approach for Single-Event Effects Testing With Heavy...

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IEEE Transactions on Nuclear Science 2010 / 12

A New Approach for Single-Event Effects Testing With Heavy Ion and Pulsed-Laser Irradiation: CMOS/SOI SRAM Substrate Removal

Kanyogoro, Nderitu, Buchner, Stephen, McMorrow, Dale, Hughes, Harold, Liu, Michael S., Hurst, Al, Carpasso, Charles
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Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2010.2085450
Date:
December, 2010
File:
PDF, 376 KB
english, 2010
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