A Built-in Self-Diagnosis and Repair Design With Fail...

IEEE Transactions on Very Large Scale Integration (VLSI) Systems 2011 / 12 Vol. 19; Iss. 12

A Built-in Self-Diagnosis and Repair Design With Fail Pattern Identification for Memories

Su, Chin-Lung, Huang, Rei-Fu, Wu, Cheng-Wen, Luo, Kun-Lun, Wu, Wen-Ching
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Volume:
19
Language:
english
Journal:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
DOI:
10.1109/TVLSI.2010.2073489
Date:
December, 2011
File:
PDF, 1.04 MB
english, 2011
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