TiO2 thin films studied by FTIR, AFM and spectroscopic...

International Journal of Nanoparticles 2013 Vol. 6; Iss. 2/3

TiO2 thin films studied by FTIR, AFM and spectroscopic ellipsometry

Bouachiba, Y., Hanini, F., Bouabellou, A., Kermiche, F., Taabouche, A., Bouafia, M., Amara, S., Sahli, S., Boukheddaden, K.
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Volume:
6
Year:
2013
Language:
english
Journal:
International Journal of Nanoparticles
DOI:
10.1504/IJNP.2013.054992
File:
PDF, 257 KB
english, 2013
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