Principle of a new reflectometer for measuring dielectric...

Principle of a new reflectometer for measuring dielectric film thickness on substrates of arbitrary surface characteristics

Sopori, B. L.
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Volume:
59
Year:
1988
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.1139817
File:
PDF, 602 KB
english, 1988
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