[IEEE 2008 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC) - Hong Kong, China (2008.12.8-2008.12.10)] 2008 IEEE International Conference on Electron Devices and Solid-State Circuits - Terahert detection analysis of nanowire gated field effect transistor
Yu Chen,, Jin He,, Xuehao Mu,, Haijun Lou,, Lining Zhang,, Yan Song,Year:
2008
Language:
english
DOI:
10.1109/EDSSC.2008.4760659
File:
PDF, 579 KB
english, 2008