[IEEE 2010 IEEE/ASME International Conference on Advanced Intelligent Mechatronics (AIM) - Montreal, QC, Canada (2010.07.6-2010.07.9)] 2010 IEEE/ASME International Conference on Advanced Intelligent Mechatronics - Development in Mechatronics — Enhancing reliability by means of a sustainable use of information
Hofmann, Daniel, Kopp, Michael, Bertsche, BerndYear:
2010
Language:
english
DOI:
10.1109/AIM.2010.5695892
File:
PDF, 164 KB
english, 2010