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Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy || Convergent Beam Electron Diffraction
Lyman, Charles E., Goldstein, Joseph I., Romig, Alton D., Echlin, Patrick, Joy, David C., Newbury, Dale E., Williams, David B., Armstrong, John T., Fiori, Charles E., Lifshin, Eric, Peters, Klaus-RuedVolume:
10.1007/97
Year:
1990
Language:
english
DOI:
10.1007/978-1-4613-0635-1_27
File:
PDF, 876 KB
english, 1990