![](/img/cover-not-exists.png)
Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy || Bulk Specimens for SEM and X-Ray Microanalysis
Lyman, Charles E., Goldstein, Joseph I., Romig, Alton D., Echlin, Patrick, Joy, David C., Newbury, Dale E., Williams, David B., Armstrong, John T., Fiori, Charles E., Lifshin, Eric, Peters, Klaus-RuedVolume:
10.1007/97
Year:
1990
Language:
english
DOI:
10.1007/978-1-4613-0635-1_28
File:
PDF, 2.53 MB
english, 1990