Scanning Electron Microscopy, X-Ray Microanalysis, and...

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Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy || Thin Specimens for TEM and AEM

Lyman, Charles E., Goldstein, Joseph I., Romig, Alton D., Echlin, Patrick, Joy, David C., Newbury, Dale E., Williams, David B., Armstrong, John T., Fiori, Charles E., Lifshin, Eric, Peters, Klaus-Rued
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Volume:
10.1007/97
Year:
1990
Language:
english
DOI:
10.1007/978-1-4613-0635-1_29
File:
PDF, 1.56 MB
english, 1990
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