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[IEEE 2012 International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO) - Xi'an, China (2012.08.29-2012.09.1)] 2012 International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO) - Optimization of thin film deposition using multi-parametric surface plasmon resonance: A new technique to determine thickness and refractive index of thin and thick layers
Kuncova-Kallio, Johana, Tuppurainen, Jussi-Pekka, Sadowski, Janusz W., Granqvist, NikoYear:
2012
Language:
english
DOI:
10.1109/3M-NANO.2012.6472952
File:
PDF, 1.14 MB
english, 2012