SPIE Proceedings [SPIE 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies (AOMATT 2012) - Xiamen, China (Thursday 26 April 2012)] 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical System Technologies for Manufacturing and Testing - Method of information hiding based on the theory of wavelet transform
Ma, Zuohong, Hua, Wenshen, Li, Xiaoming, Zhang, Yue, Lin, Xiangdi, Namba, Yoshiharu, Xing, TingwenVolume:
8420
Year:
2012
Language:
english
DOI:
10.1117/12.974265
File:
PDF, 365 KB
english, 2012