SPIE Proceedings [SPIE SPIE Defense, Security, and Sensing - Baltimore, Maryland, USA (Monday 29 April 2013)] Infrared Technology and Applications XXXIX - High-resistivity and high-TCR vanadium oxide thin films for infrared imaging prepared by bias target ion-beam deposition
Jin, Yao, Basantani, Hitesh A., Ozcelik, Adem, Jackson, Tom N., Horn, Mark W., Andresen, Bjørn F., Fulop, Gabor F., Hanson, Charles M., Norton, Paul R., Robert, PatrickVolume:
8704
Year:
2013
Language:
english
DOI:
10.1117/12.2016277
File:
PDF, 412 KB
english, 2013