Quality Assessment of Sapphire Wafers for X-Ray Crystal...

physica status solidi (a) 2001 Vol. 186; Iss. 3

Quality Assessment of Sapphire Wafers for X-Ray Crystal Optics Using White Beam Synchrotron X-Ray Topography

W.M. Chen, P.J. McNally, Yu.V. Shvydko, T. Tuomi, M. Lerche, A.N. Danilewsky, J. Kanatharana, D. Lowney, M. O'Hare, L. Knuuttila, J. Riikonen, R. Rantamäki
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Volume:
186
Year:
2001
Language:
english
Pages:
7
DOI:
10.1002/1521-396x(200108)186:33.0.co;2-9
File:
PDF, 162 KB
english, 2001
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