SPIE Proceedings [SPIE 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies (AOMATT 2012) - Xiamen, China (Thursday 26 April 2012)] 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - Plasma spectrum peak extraction algorithm of laser film damage
Zhao, Dan, Su, Jun-hong, Xu, Jun-qi, Zhang, Yudong, Xiang, Libin, To, SandyVolume:
8417
Year:
2012
Language:
english
DOI:
10.1117/12.973677
File:
PDF, 402 KB
english, 2012