[IEEE 2013 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) - Minneapolis, MN, USA (2013.05.6-2013.05.9)] 2013 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) - A digital calibration technique for cyclic ADCs using MOS capacitors
Wei, Zhiheng, Kawahito, ShojiYear:
2013
Language:
english
DOI:
10.1109/I2MTC.2013.6555608
File:
PDF, 388 KB
english, 2013