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[IEEE 2001 International Symposium on Electron Devices for Microwave and Optoelectronic Applications. EDMO 2001 - Vienna, Austria (15-16 Nov. 2001)] 2001 International Symposium on Electron Devices for Microwave and Optoelectronic Applications. EDMO 2001 (Cat. No.01TH8567) - Green's function concept for noise model of microwave FET analysis

Khosravi, R., Abdipour, A.
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Year:
2001
Language:
english
DOI:
10.1109/EDMO.2001.974320
File:
PDF, 330 KB
english, 2001
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