[IEEE 2001 International Symposium on Electron Devices for Microwave and Optoelectronic Applications. EDMO 2001 - Vienna, Austria (15-16 Nov. 2001)] 2001 International Symposium on Electron Devices for Microwave and Optoelectronic Applications. EDMO 2001 (Cat. No.01TH8567) - Green's function concept for noise model of microwave FET analysis
Khosravi, R., Abdipour, A.Year:
2001
Language:
english
DOI:
10.1109/EDMO.2001.974320
File:
PDF, 330 KB
english, 2001